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Gannen-XP - ultra precision tactile probe

The basis of the 3D Gannen probe is a silicon chip with integrated piezo resistive elements. One point probing and scanning is possible with ultra low uncertainty. The probe is lightweight with a colliding mass of approximately 34 mg. Combined with a stiffness down to 150 N/m this allows high speed measurements with probing forces down to a few micro Newtons, depending on the CMM used.

Measurements using the XPRESS probe shown a 3D uncertainty of 45 nm and a 1D repeatability of 2 nm or less (standard deviation) in any direction and over its entire measurement range.

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Xpress Precision Engineering
Horsten 1
5612AX Eindhoven ()
Homepage: http://www.xpresspe.com