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TEM analysis
Very high resolution imaging of electron transparent membranes (created by FIB). May be used for performing metrology and structural analysis of features and failures to a few atomic layers thickness

Company
NanoScope Services Ltd
Station Road Workshops No 30
BS15 4PJ Kingswood, Bristol ()
P.O. Box: United Kingdom
Homepage: http://www.nanoscopeservices.com

Contact
Mr Alan Miller
Phone: +44(0)1179576225
Fax: +44(0)1179568776
alan.miller@nanoscopeservices.com