Sprache wechseln: English

Suchbegriff oder Artikelnummer
 
Artikelbezeichnung und Beschreibung durchsuchen
Auch Unternehmensverzeichnis durchsuchen


SARFUS RAPID LOCALISATION TOOL FOR AFM
APPLICATIONS: Nanometric film and layer, Lithography, Pattern, Biological systems, Surface treatment, Nanotube, Nanoparticle

KEY FEATURES: • Allow Rapid localisation of nano-objects with optical microscope • Compatible with major AFM apparatus • Combined optical (Sarfus) and mechanical (AFM) analyses • Easy to use, no scanning, no labelling. Observation in air or in water • Large range of field of view: from 60µm² (100x) to several mm² (2.5x)

Company
NANOLANE
Parc des Sittelles
72450 Montfort-le-Gesnois (France)
Homepage: http://www.nano-lane.com

Contact
Dr Philippe CROGUENNOC
Phone: +33 2 43 540 900
Fax: +33 2 43 540 909
nanolane@eolane.com