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| NEON® Series |
The novel Zeiss NEON® series allows a flexible combination of the Gemini® technology with the full CrossBeam® functionality to yield an extremely powerful 3D analysis workstation.
With its unique upgrade path concept the NEON® allows to extend the proven analysis and imaging capabilities of the ultra-high resolution, low dose Gemini® Field Emission Scanning Electron Microscope (FESEM) to the third dimension.
NEON® is now available in three different platform configurations
NEON® 40 / NEON® 40EsB for small to medium sized samples and general purpose applications
NEON® 60 Large chamber with 6“ stage and integrated 8“ airlock