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M4PP SEM Module
CAPRES A/S has succeeded to combine microscopic sheet resistance characterization together with Scanning Electroscopy Microscopy (SEM) and Focused Ion Beam Systems (FIB). The M4PP SEM Module makes use of the advanced microprobe technology, the Micro 4 Point Probe, developed by CAPRES A/S. With the M4PP SEM module at hand, the operator of a SEM or FIB will have the capability to make micro- and nanoscale conductivity measurements on a wide range of materials and devices.

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Company
CAPRES AS
SCION-DTU, Diplomvej 373
2800 KGS LYNGBY (DENMARK)
Homepage: http://www.capres.com/

Contact
VP Sales and Marketing Olivier DULAC
Phone: +45 45 25 67 00
Fax: +45 45 25 67 10
od@capres.com