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SIMS Workstation for high sensitivity surface analysis on the nanoscale.
A cost effective materials analysis solution providing chemical composition analysis of the upper most layes in surfaces.
Application include depth profiling thin film multilayers in the nano scale, and static SIMS provides analysis of the first few monolayers of a surface.
SNMS compliments SIMS providing quantitative analysis of layer composition without the requirement for reference materials.

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Company
Hiden Analytical
420 Europa Boulevard
WA5 7UN Warrington (UK)
Homepage: http://www.HidenAnalytical.com

Contact
Peter Hatton
Phone: +44 (0) 1925445225
Fax: +44 (0) 1925 416518
phatton@hiden.co.uk