Tascon has been offering its customers consulting, seminars and analytical services around the solid surface as a certified and accredited test laboratory since 1997. Our core competence consists of surface analytical techniques (e.g. Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS), Low Energy Ion Scattering (LEIS, ISS) and X-ray Photoelectron Spectroscopy (XPS, ESCA)), optical characterisation of surface topography (White Light Interferometry, Confocal microscopy) and various preparational techniques. Further analytical techniques such as SEM/EDX, TEM, AFM, GDOES and FTIR are offered through co-operations with specialised partner laboratories.
The unique combination of state of the art equipment with application know-how makes us a reliable partner in research and development, quality assurance as well as the analysis of active or harmful components in micro- and nanotechnology. You can find more information at: www.tascon.eu