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Scanning Probe Microscope "Certus"
Available in Light, Standard and Optic versions. All based on Certus SPM head. The main distinguishing features of Certus are:

* Plane-parallel XYZ scanner with capacitive sensors on all axes;
* Flexible configuration allows to use a wide range of lasers for deflectometer (up to a stationary external lasers);
* Easy-site attachment of the probe to probe holder, allows a fundamentally different types of probes to be used;
* Open work area (point of contact of the probe and the sample), which provides easy monitoring of the probe, enter the external radiation, etc.;
* Parallel approach oprobe to the sample with the ability automatically align the head above the plane of the sample;
* Fully digital connection between the head and controller.

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NanoScanTechnologies Ltd.
Zavodskaya 7
141700 Dolgoprudny ()
Homepage: http://www.nanoscantech.com

Mr. Alexei Mezin
Phone: +7 (495) 665 00 85
Fax: 0